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  • QR450-7 XSR Reflection/Backscatter Probes


Item Code: QR450-7-XSR

Lead Time: 2 weeks



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A reflection/backscatter probe is a compact, versatile sampling option to measure diffuse and specular reflectance, backscatter, or fluorescence from samples as varied as solids, solutions, and powders. Reflection and backscatter measurements can provide quantitative information about the color, appearance, and chemical composition of a sample.



  • General purpose -- ideal for diffuse or specular reflectance from solids; fluorescence; color
  • XSR fibers -- probe assembly comprises extreme solarization-resistant fibers (180-800 nm)
  • Probe design -- 6-around-1 fiber bundle design, with 6-fiber leg connecting to light source and single-fiber leg connecting to spectrometer 



Subject to change depending on model type


Wavelength Range:
180nm - 800nm
Fiber Core Size:
450 µm
2 m
Silicone-coated steel monocoil
Probe Ferrule Diameter:
6.35 mm (1/4″)
Midway point of assembly at 1 meter
Buffer Materials:
Aluminum, Nylon, Silicone
Cladding OD:
500 µm
Cladding OD Tolerance:
± 25 µm
SMA 905
Fiber Core Size Tolerance:
± 22 μm
Long Term Bend Radius:
8 cm
Maximum OD:
1300 µm
Maximum OD Tolerance:
± 100 µm
Numerical Aperture:
0.22 ± 0.02 (equivalent to an acceptance angle of 24.8° in air)
Primary Buffer OD:
580 µm
Probe Fiber Bundle:
6 illumination fibers around 1 read fiber
Short Term Bend Radius:
4 cm
Probe Ferrule Length:
76.2 mm (3″)
Probe Ferrule Material:
Stainless steel


Operating Temperature:
-50 to 80 °C