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Flame Irradiance

Lead Time: 2 weeks

From $5,901.00

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The Flame-S-RAD is a preconfigured spectrometer for irradiance measurements including LED characterization and upwelling/downwelling measurements.

The Flame-S-RAD covers the UV-Visible wavelength range (200-850 nm) and includes a CC-3-DA cosine corrector to collect signal from 180° field of view and SPEC-CAL-UV radiometric calibration service.


  • Modular – covers the 200-850 nm range
  • Convenient – plug-and-play functionality for UV-Visible irradiance measurements
  • Irradiance-ready -- includes radiometrically calibrated spectrometer and direct-attach cosine corrector 
  • Portable – fiber optic based spectrometer you can bring to the sample
  • Compatible – triggering functions synchronize the spectrometer to other devices
Key Feature Benefits

Example Applications

Small yet Rugged Design Its small size – just 89.1 mm x 63.3 mm x 31.9 mm – makes Flame-NIR+ ideal for integrating into portable and handheld systems. With no moving parts, the spectrometer holds up well in demanding industrial process control environments.

Identification of types and colors of plastics in recycling

Analysis of freshness and sweetness in fruits and vegetables

High Sensitivity Flame-NIR+ has up to 6x increased sensitivity compared with earlier models, offering lower limits of detection and allowing for shorter integration times.               

Chemical and commodity manufacturing

Identification of pharmaceutical ingredients

Low Unit to Unit Variation Precision alignment and assembly techniques have reduced unit to unit variance in almost every aspect, including uncalibrated sensitivity.

OEM manufacturing of analytical instrumentation

Product integration

QC engineering in large-scale manufacturing operations

Low Power Drawing <250 mA at 5V, Flame-NIR+ can be powered almost anywhere –and integrated into other devices and industrial process control environments.

Process control monitoring

In-line QC analysis


Select model to see full specifications


Wavelength Range:
200nm - 850nm
Optical Resolution:
1.34 nm FWHM (typical)
Integration Time:
1ms - 65s
Corrected linearity:
Dark Noise:
50 RMS counts
Dynamic Range:
1300:1 for a single acquisition
8.5 x 10^7 (system)
Signal to Noise Ratio:
250:1 (full signal)


linear silicon CCD array
Entrance slit:
50 ┬Ám
Detector Collection Lens:


A/D Resolution:
16 bit
high density 40 pin JAE DD4 connector
8 x user programmable GPIOs
Trigger Modes:
4 modes
Power Consumption:
250 mA @ 5 VDC


89.1 mm x 63.3 mm x 31.9 mm (34.4 mm with feet)
265 g

Measurement techniques