SR4 Series Spectrometers

High SNR and Thermal Wavelength Stability

Versatile and robust, SR4 spectrometers offer high SNR and thermal wavelength stability for applications including plasma monitoring and reflection measurements. The spectrometer is anchored by a CCD-array detector and low-noise electronics for accurate, reliable results.

SR4 Series

SpecificationsWavelength RangeResolution (FWHM) (configuration-dependent)Grating Groove Density (lines/mm)Grating Blaze Wavelength
UV-Vis options:220-410 nm0.42 nm – 3.36 nm1800Holographic
220-535 nm0.58 nm – 4.62 nm1200Holographic
220-925 nm1.17 nm – 9.24 nm600240 nm
220-910 nm1.17 nm – 9.24 nm600300 nm
220-910 nm1.17 nm – 9.24 nm600400 nm
Vis-NIR options:350-1040 nm1.17 nm – 9.24 nm600400 nm
350-1040 nm1.17 nm – 9.24 nm600500 nm
NIR options:570-860 nm0.58 nm – 4.62 nm1200750 nm
600-1050 nm1.17 nm – 9.24 nm6001000 nm
Extended-range options:220-1050 nm1.43 nm – 11.34 nm500250 nm
Slit Options5, 10, 25, 50, 100, 200 µm
Integration Time3.8ms-10s
SNR (single scan @ 10 ms)250:1
SNR (max. per second w/High Speed Averaging Mode):3000:1
ConnectorsUSB Type-C, SMA, 16 pin Samtec TFM, RS-232
Physical Dimensions88.1 x 63.5 x 31.45 mm
Weight275 g
Temperature (operation)0 °C – 55 °C
Temperature (storage)-30 °C to 70 °C

Click here for SR4 Series Product Insight (Manuals, Spec Sheets, App Notes)