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  • Maya2000 Pro

Maya2000 Pro Series Spectrometer

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Product Details

Maya2000 Pro spectrometers are a great choice for applications requiring high sensitivity, good UV-NIR response and wide dynamic range. Applications range from low light level fluorescence and Raman measurements to absorbance, transmission and emission analysis of solutions, solids and gases.

Maya2000 Pro spectrometers are available in custom configured (you select the ideal combination of bench components) and preconfigured (we optimize the spectrometer for specific applications) options.

Product Overview

  • Powerful – extra-sensitive spectrometer for absorbance, transmission and low light measurements including fluorescence and Raman 
  • Flexible – connect accessories to the Maya2000 Pro and take advantage of triggering capabilities for more complex applications
  • Sensitive – high performance back-thinned 2D CCD detector
  • Cost-effective – great performance for a fraction of the cost of traditional benchtop instruments

Need a custom configured spectrometer?

Flexibility in the selection of gratings, slits and other components
allows users to customize solutions for specific measurement challenges.

Contact us to find out how a spectrometer can be configured.

Engineering Specifications Maya2000 Pro (user configured)
Spectral range (detector response): ~165-1100 nm
Optical resolution (FWHM): Depends on grating groove density and slit size (multiple options available)
Signal-to-noise ratio at full signal: ~450:1
Dynamic range: 15000:1 (typical)
Integration time: 7.2 ms-5 seconds
Fiber optic connector: SMA 905 to 0.22 numerical aperture single-strand optical fiber
Power requirement: 500 mA @ 5 VDC
Strobe functions: Yes
Trigger modes: 4 modes
Interfaces: USB 2.0, RS-232
Type: Back-thinned, 2D
Quantum efficiency: 75% peak @ 600 nm

148.6 x 109.2 x 46.4 mm without feet

148.6 x 109.2 x 49.3 mm with feet
Weight: 0.96 kg (2.1 lb.)
Operating temperature: 0 °C – 50 °C
Humidity: ≤90% non-condensing
Material: RoHS
Electrical: EN61326-1:2013, CISPR 11:2009/A1:2010

Measurement techniques