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  • QR600-7-UV125BX Reflection/Backscatter Probes

Extreme Solarization Resistant Reflection/Backscatter Probes

Lead Time: 2 weeks

From $837.00

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Details

A reflection/backscatter probe is a compact, versatile sampling option to measure diffuse and specular reflectance, backscatter, or fluorescence from samples as varied as solids, solutions, and powders. Reflection and backscatter measurements can provide quantitative information about the color, appearance, and chemical composition of a sample.

 

Overview

  • General purpose -- ideal for diffuse or specular reflectance from solids; fluorescence; color
  • XSR fibers -- probe assembly comprises extreme solarization-resistant fibers (180-800 nm)
  • Probe design -- 6-around-1 fiber bundle design, with 6-fiber leg connecting to light source and single-fiber leg connecting to spectrometer 

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Specifications

Subject to change depending on model type

Engineering:

Wavelength Range:
180nm - 800nm
Fiber Core Size:
230 µm, 450 µm
Length:
2 m
Jacket:
Silicone-coated steel monocoil
Probe Ferrule Diameter:
6.35 mm (1/4″)
Breakout:
Midway point of assembly at 1 meter
Buffer Materials:
Aluminum, Nylon, Silicone, Aluminum, Polymer
Cladding OD:
250 µm, 500 µm
Cladding OD Tolerance:
± 13 µm, ± 25 µm
Connector:
SMA 905
Fiber Core Size Tolerance:
± 12 μm, ± 22 μm
Long Term Bend Radius:
4 cm, 8 cm
Maximum OD:
1300 µm, 380 µm
Maximum OD Tolerance:
± 100 µm, ± 20 µm
Numerical Aperture:
0.22 ± 0.02 (equivalent to an acceptance angle of 24.8° in air)
Primary Buffer OD:
300 µm, 580 µm
Probe Fiber Bundle:
6 illumination fibers around 1 read fiber
Short Term Bend Radius:
2 cm, 4 cm
Probe Ferrule Length:
76.2 mm (3″)
Probe Ferrule Material:
Stainless steel

Environmental:

Operating Temperature:
-50 to 80 °C

Measurement techniques